Electric field sensor, system, and method for programming electronic devices on a wafer
US-2016306007-A1 · Oct 20, 2016 · US
US9110109B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9110109-B2 |
| Application number | US-201313867421-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 22, 2013 |
| Priority date | Apr 23, 2012 |
| Publication date | Aug 18, 2015 |
| Grant date | Aug 18, 2015 |
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A potential measuring device which measures a charged object in a non-contact manner with a sensor may include a first shutter having a first shutter part, which is provided with a first opening which can be positioned at a position opposing the sensor, and leaf spring parts extending from both ends thereof; a second shutter having a second shutter part, which is provided with a second opening which can be positioned at a position opposing the sensor and the first opening, and leaf spring parts extending from both ends thereof; a coil provided so that a direction along a center axis opposes portions of the leaf spring parts; and a magnet provided on each of regions opposing both end sides of the coil in the leaf spring parts extending from the both ends of each of the first shutter part and the second shutter part.
Opening claim text (preview).
What is claimed is: 1. A potential measuring device which measures a surface potential of a charged object in a non-contact manner with a sensor disposed to oppose the charged object, the device comprising: a first shutter having a first shutter part, which is disposed between the charged object and the sensor and has a first opening, and leaf spring parts extending from both ends of the first shutter part; a second shutter having a second shutter part, which is disposed between…
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