Optical microscope and optical instrumentation

Patent metadata

Field	Value
Publication number	US-9109954-B2
Application number	US-201314107081-A
Country	US
Kind code	B2
Filing date	Dec 16, 2013
Priority date	Jun 3, 2009
Publication date	Aug 18, 2015
Grant date	Aug 18, 2015

Abstract

An optical microscope that can prevent an increase in the complexity of the light source system is equipped with optics readily capable of adequate operation even when the modulation frequency is increased to reduce the impact of the intensity noise of the laser. The optical microscope irradiates a sample with a first train of optical pulses having a first optical frequency, which is generated by a first light source, and a second train of optical pulses having a second optical frequency, which is temporally synchronized with the first train of optical pulses and is generated by a second light source, and detects light scattered from the sample. A first repetition frequency of the first train of optical pulses is an integral sub-multiple of a second repetition frequency of the second train of optical pulses.

First claim

The invention claimed is:

1. An optical microscope comprising:
a first light source configured to irradiate a sample with first optical pulses having a first optical frequency;
a second light source configured to irradiate the sample with second optical pulses having a second optical frequency, which is temporally synchronized with the first optical pulses, the first and second light sources being configured to generate the first and second optical pulses without using a shared…

Assignees

• Canon Kk

Inventors

• Ozeki Yasuyuki
• Itoh Kazuyoshi
• Dake Fumihiro
• Fukui Kiichi
• Kajiyama Shinichiro
• Kitagawa Yuma
• Nishizawa Norihiko
• Sumimura Kazuhiko

Classifications

• G01N2021/655

  Physics · mapped topic

• G02B21/365

  Physics · mapped topic

• G02B21/06

  Physics · mapped topic

• G01N21/65 Primary

  Physics · mapped topic

• G01J3/4412 Primary

  Physics · mapped topic