Method and apparatus for compensating for a time-varying disturbance in interferometric sensing systems
US-9841269-B2 · Dec 12, 2017 · US
US9109879B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9109879-B2 |
| Application number | US-201313777112-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 26, 2013 |
| Priority date | Feb 29, 2012 |
| Publication date | Aug 18, 2015 |
| Grant date | Aug 18, 2015 |
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Systems for and methods of characterizing the thickness profile of laminated glass structures are disclosed, wherein the laminated glass structure has at least one gradual transition region between adjacent glass layers. The method includes sequentially focusing laser light at different focuses along a line within the laminated glass structure. The sequentially formed focuses define corresponding micro-volumes from which fluorescent light emanates due to a multiphoton process. The variation in the intensity of the detected fluorescent light from each micro-volume as a function of distance into the laminated glass structure is used to determine the relative locations of the multiple layers and the at least one gradual transition region.
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What is claimed is: 1. A method of characterizing a thickness profile of a laminated glass structure having a first surface, a body comprising multiple layers and at least one gradual transition region between adjacent layers, the method comprising: focusing laser light of a first wavelength within the body of the laminated glass structure through the first surface at a surface location and sequentially at different focuses at different distances along a line into the body to caus…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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