Annealing for damage free laser processing for high efficiency solar cells
US-9214585-B2 · Dec 15, 2015 · US
US9105786B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9105786-B2 |
| Application number | US-201213446450-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 13, 2012 |
| Priority date | Apr 18, 2011 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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Efficiency of silicon photovoltaic solar cells is increased by an annealing process for immobilizing oxygen formed in Czochralski-grown silicon. The annealing process includes a short anneal in a rapid thermal annealing chamber at a high temperature, for example, greater than 1150° C. in an oxygen-containing ambient. More preferably, the wafer is rapidly cooled to less than 950° C. without an intermediate temperature hold, at which temperature oxygen does not nucleate and/or precipitate. Subsequent processing to form a photovoltaic structure is typically performed at relatively low temperatures of less than 1000° C. or even 875° C.
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What is claimed is: 1. A process for forming a photovoltaic solar wafer, comprising the steps of: growing a silicon ingot by the Czochralski process; mechanically forming a plurality of silicon wafers from the ingot; annealing at least one of the wafers at an annealing temperature of greater than 1150° C. in an oxygen-containing ambient for a time of between 1 and 60 seconds; and then fabricating a photovoltaic solar cell structure including a semiconductor junction in the a…
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