Semiconductor device and manufacturing method of the same
US-2015364490-A1 · Dec 17, 2015 · US
US9105725B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9105725-B2 |
| Application number | US-201414154538-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 14, 2014 |
| Priority date | Sep 11, 2013 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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A semiconductor device includes a semiconductor-on-insulator (SOI) substrate having a bulk substrate layer, an active semiconductor layer, and a buried insulator layer interposed between the bulk substrate layer and the active semiconductor layer. A first source/drain (S/D) region includes a first stand-alone butting implant having a first butting width. A second S/D region includes a second stand-alone butting implant having a second butting width. A gate well-region is interposed between the first and second S/D regions. The gate well-region has a gate width that is greater than the first and second butting widths.
Opening claim text (preview).
What is claimed is: 1. A method of forming a semiconductor device including a semiconductor substrate, the method comprising: forming a masking layer on an active semiconductor layer of the semiconductor substrate, the semiconductor substrate including a bulk substrate layer, and a buried insulator layer interposed between the bulk substrate layer and the active semiconductor layer; designating at least one source/drain (S/D) area of the semiconductor substrate; patterning the…
Electricity · mapped topic
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