Method for forming self-aligned contacts/vias with high corner selectivity

US9105700B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9105700-B2
Application numberUS-201314105073-A
CountryUS
Kind codeB2
Filing dateDec 12, 2013
Priority dateDec 12, 2013
Publication dateAug 11, 2015
Grant dateAug 11, 2015

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Abstract

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A method of etching self-aligned contact/via features in a low-k dielectric layer disposed below a hardmask, which is disposed below a planarization layer. At least one cycle is provided, where each cycle comprises thinning the planarization layer, forming a deposition layer on the hardmask and planarization layer; and etching the low-k dielectric layer masked by the deposition layer.

First claim

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What is claimed is: 1. A method of etching self-aligned contact/via features in a dielectric layer disposed below a hardmask, which is disposed below a planarization layer, comprising at least one cycle, wherein each cycle comprises: thinning the planarization layer; forming a deposition layer on the hardmask and planarization layer; and etching the dielectric layer masked by the deposition layer. 2. The method, as recited in claim 1 , wherein the etchin…

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What does patent US9105700B2 cover?
A method of etching self-aligned contact/via features in a low-k dielectric layer disposed below a hardmask, which is disposed below a planarization layer. At least one cycle is provided, where each cycle comprises thinning the planarization layer, forming a deposition layer on the hardmask and planarization layer; and etching the low-k dielectric layer masked by the deposition layer.
Who is the assignee on this patent?
Lam Res Corp
What technology area does this patent fall under?
Primary CPC classification H10P50/283. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 11 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).