Manufacturing method for semiconductor structure
US-12165910-B2 · Dec 10, 2024 · US
US9105700B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9105700-B2 |
| Application number | US-201314105073-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 12, 2013 |
| Priority date | Dec 12, 2013 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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A method of etching self-aligned contact/via features in a low-k dielectric layer disposed below a hardmask, which is disposed below a planarization layer. At least one cycle is provided, where each cycle comprises thinning the planarization layer, forming a deposition layer on the hardmask and planarization layer; and etching the low-k dielectric layer masked by the deposition layer.
Opening claim text (preview).
What is claimed is: 1. A method of etching self-aligned contact/via features in a dielectric layer disposed below a hardmask, which is disposed below a planarization layer, comprising at least one cycle, wherein each cycle comprises: thinning the planarization layer; forming a deposition layer on the hardmask and planarization layer; and etching the dielectric layer masked by the deposition layer. 2. The method, as recited in claim 1 , wherein the etchin…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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