High electron mobility transistor and manufacturing method thereof
US-9209266-B2 · Dec 8, 2015 · US
US9105464B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9105464-B2 |
| Application number | US-201213816173-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 18, 2012 |
| Priority date | Oct 19, 2012 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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A semiconductor structure with a rare earth oxide is provided. The semiconductor structure comprises: a semiconductor substrate ( 100 ); and a plurality of insulation oxide layers ( 201, 202 . . . 20 x ) and a plurality of single crystal semiconductor layers ( 301, 302 . . . 30 x ) alternately stacked on the semiconductor substrate ( 100 ). A material of the insulation oxide layer ( 201 ) contacted with the semiconductor substrate ( 100 ) is any one of a rare earth oxide, SiO 2 , SiO x N y and a combination thereof, a material of other insulation oxide layers ( 202 . . . 20 x ) is a single crystal rare earth oxide.
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What is claimed is: 1. A semiconductor structure with a rare earth oxide, comprising: a semiconductor substrate; and a plurality of insulation oxide layers and a plurality of single crystal semiconductor layers alternately stacked on the semiconductor substrate, wherein a material of the insulation oxide layer contacted with the semiconductor substrate is any one of a rare earth oxide, SiO 2 , SiO x N y and a combination thereof, a material of other insulation oxide layers is…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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