Non-volatile memory and methods of fabricating the same
US-2024268126-A1 · Aug 8, 2024 · US
US9105360B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9105360-B2 |
| Application number | US-201313789123-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 7, 2013 |
| Priority date | Mar 7, 2013 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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An incremental signal is defined that includes at least one of a duration and a peak voltage that is less than a respective minimum programming time or minimum programming voltage step of a resistive memory element. A characterization procedure is repeatedly performed that at least involves: applying a signal to the memory element, the signal being incremented by the incremental signal during each subsequent application; measuring a first resistance of the memory element in response to the signal; and c) measuring a second resistance of the memory element after a time period has elapsed from the measurement of the first resistance with no programming signal applied. In response to the first and second resistance measurements of the characterization procedure, a characterization parameter of the memory element is formed.
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What is claimed is: 1. A method comprising: defining an incremental signal that comprises at least one of a duration and a peak voltage that is less than a respective minimum programming time or minimum programming voltage step of a resistive memory element; repeatedly performing a characterization procedure involving: applying a signal to the resistive memory element, the signal being incremented by the incremental signal during each subsequent application; measuring a first…
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