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Apparatus and method for measuring electromagnetic wave
US9104912B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9104912-B2 |
| Application number | US-201013520701-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 28, 2010 |
| Priority date | Jan 8, 2010 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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- Title
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Abstract
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The present invention provides an apparatus and a method for transforming a time waveform of an electromagnetic wave into a time waveform suited for signal processing and the like so as to measure the time waveform. A wavelet transform is performed on a first time waveform of an electromagnetic wave, such as a terahertz wave, measured in advance, and a second time waveform suited for signal processing and having a high correlation with a mother wavelet used in the wavelet transform is formed by controlling a wavelet expansion coefficient. In a second measurement process and onward of a target object, a transforming unit, such as a bias voltage controller, is used to transform the electromagnetic wave into a transformed time waveform so as to measure the time waveform.
First claim
Opening claim text (preview).
The invention claimed is: 1. A terahertz electromagnetic wave measuring apparatus for measuring a measured terahertz electromagnetic wave, comprising: a generating unit configured to generate a reference terahertz electromagnetic wave; a waveform obtaining unit configured to obtain a first reference time waveform from the reference terahertz electromagnetic wave received in dependence of plural delay times; a forming unit configured to perform a wavelet transform on the first…
Assignees
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Physics · mapped topic
- G06F18/00Primary
Physics · mapped topic
- G06K9/00516Primary
Physics · mapped topic
Physics · mapped topic
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Frequently asked questions
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- What does patent US9104912B2 cover?
- The present invention provides an apparatus and a method for transforming a time waveform of an electromagnetic wave into a time waveform suited for signal processing and the like so as to measure the time waveform. A wavelet transform is performed on a first time waveform of an electromagnetic wave, such as a terahertz wave, measured in advance, and a second time waveform suited for sign…
- Who is the assignee on this patent?
- Shioda Michinori, Ouchi Toshihiko, Canon Kk
- What technology area does this patent fall under?
- Primary CPC classification G06F18/00. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Aug 11 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).