Two-tier defect scan management
US-2024402922-A1 · Dec 5, 2024 · US
US9104568B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9104568-B2 |
| Application number | US-201313835985-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 15, 2013 |
| Priority date | Mar 15, 2013 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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A method for detecting memory cells that are stuck in a physical state. The method includes performing a diagnostic read of a memory cell in a memory system. The memory system is configured to utilize at least one read threshold value to determine a read data value stored in the memory cell when performing a data read operation on the memory cell. Performing the diagnostic read includes: comparing a measurement property of the memory cell to at least one diagnostic threshold value, where at least one of the diagnostic threshold values is different from all of the read threshold values; and identifying the memory cell as being stuck in a physical state based on the comparing. Based on identifying the memory cell as being stuck in a physical state, an indication that memory cell is stuck is output along with a diagnostic data value associated with the physical state.
Opening claim text (preview).
What is claimed is: 1. A method comprising: performing a diagnostic read of a memory cell in a memory system, the memory system configured to utilize at least one read threshold value to determine a read data value stored in the memory cell when performing a data read operation on the memory cell, the performing a diagnostic read comprising: comparing a measurement property of the memory cell to at least one diagnostic threshold value, at least one of the diagnostic threshold val…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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