Integrated circuit with plural comparators receiving expected data and mask data from different pads

Patent metadata

Field	Value
Publication number	US-9103885-B2
Application number	US-201414494092-A
Country	US
Kind code	B2
Filing date	Sep 23, 2014
Priority date	Nov 28, 2001
Publication date	Aug 11, 2015
Grant date	Aug 11, 2015

Abstract

Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response patterns from the tester are input to the test circuits along with the output response of the die/IC to be compared. Also disclosed is the use of a response signal encoding scheme whereby the tester transmits response test commands to the test circuits, using a single signal per test circuit, to perform: (1) a compare die/IC output against an expected logic high, (2) a compare die/IC output against an expected logic low, and (3) a mask compare operation. The use of the signal encoding scheme allows functional testing of die and ICs since all response test commands (i.e. 1-3 above) required at each die/IC output can be transmitted to each die/IC output using only a single tester signal connection per die/IC output. In addition to functional testing, scan testing of die and ICs is also possible.

First claim

What is claimed is:

1. An integrated circuit comprising:
A. input pads and output pads;
B. core circuitry having inputs coupled to the input pads and outputs coupled to the output pads, the core circuitry including a first core output coupled to a first output pad, and the core circuitry including a second core output coupled to a second output pad;
C. first comparator circuitry having an input coupled to the first core output, an expected data input coupled to the first outpu…

Assignees

• Texas Instruments Inc

Inventors

• Whetsel Lee D
• Hales Alan

Classifications

• G01R31/31926

  Physics · mapped topic

• G01R31/318536 Primary

  Physics · mapped topic

• G01R1/07342

  Physics · mapped topic

• G01R31/318572

  Physics · mapped topic

• G01R31/318555

  Physics · mapped topic