Method and apparatus for using radiation imaging data to analyze components
US-2024369500-A1 · Nov 7, 2024 · US
Apparatus and methods for controlling electron microscope stages
US9103769B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9103769-B2 |
| Application number | US-96802410-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 14, 2010 |
| Priority date | Dec 15, 2009 |
| Publication date | Aug 11, 2015 |
| Grant date | Aug 11, 2015 |
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Abstract
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Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample. Movement of the sphere causes movement of the stage, wherein the stage coordinates move in conjunction with the crystallographic coordinates represented by pole positions so as to show a relationship between stage positions and the pole positions.
First claim
Opening claim text (preview).
What is claimed is: 1. A method of generating an image or diffraction patterns from a crystal sample with a microscope having a beam generator for directing an incident beam towards a crystal sample, a stage for holding and moving the crystal sample, a detector for detecting beams that are scattered from the sample in response to the incident beam, and an image generator for generating an image or diffraction patterns of the crystal sample from the scattered beams, the method compr…
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Electricity · mapped topic
- G01N23/203Primary
Physics · mapped topic
- G01N23/205Primary
Physics · mapped topic
Electricity · mapped topic
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Frequently asked questions
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- What does patent US9103769B2 cover?
- Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive contro…
- Who is the assignee on this patent?
- Duden Thomas, Univ California
- What technology area does this patent fall under?
- Primary CPC classification G01N23/203. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Aug 11 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).