Optical analysis device and optical analysis method using a wavelength characteristic of light of a single light-emitting particle

US9103718B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9103718-B2
Application numberUS-201313888868-A
CountryUS
Kind codeB2
Filing dateMay 7, 2013
Priority dateNov 25, 2010
Publication dateAug 11, 2015
Grant dateAug 11, 2015

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  5. First independent claim

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Abstract

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The inventive technique of detecting and analyzing light from a light-emitting particle in accordance with the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope is characterized by detecting intensities of components of two or more wavelength bands of light from a light detection region of an optical system with moving the position of the light detection region in a sample solution by changing the optical path of the optical system of the microscope; detecting individually signals of the light from each light-emitting particle in the intensities of the components of the two or more wavelength bands of the detected light; and identifying a kind of light-emitting particle based on the intensities of the components of the two or more wavelength bands of the signals of the light of the detected light-emitting particle.

First claim

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The invention claimed is: 1. An optical analysis device which detects and analyzes light from a light-emitting particle dispersed and moving at random in a sample solution using an optical system of a confocal microscope or a multiphoton microscope, the device comprising: a light detection region moving portion which moves a position of a light detection region of the optical system in the sample solution by changing an optical path of the optical system; a light detecting porti…

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What does patent US9103718B2 cover?
The inventive technique of detecting and analyzing light from a light-emitting particle in accordance with the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope is characterized by detecting intensities of components of two or more wavelength bands of light from a light detection region of an optical system with moving the posi…
Who is the assignee on this patent?
Olympus Corp
What technology area does this patent fall under?
Primary CPC classification G01N21/6458. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 11 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).