Wired circuit board having enhanced contrast between conductive pattern and insulating layer during inspection

US9084359B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9084359-B2
Application numberUS-201113137300-A
CountryUS
Kind codeB2
Filing dateAug 4, 2011
Priority dateSep 6, 2010
Publication dateJul 14, 2015
Grant dateJul 14, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for producing a wired circuit board includes the steps of preparing a metal supporting layer; forming an insulating layer on the metal supporting layer; roughening the surface of the insulating layer; forming a conductive pattern on the insulating layer; and inspecting the presence or absence of a defect of the conductive pattern by using an inspection device provided with a light emitting portion emitting incident light that enters the insulating layer and the conductive pattern and a light receiving portion receiving reflected light that is reflected from the incident light. The incident light has a wavelength in the range of 435 to 500 nm and includes inclined light that inclines so as to form an angle of more than 0° to not more than 30° with respect to the optical axis thereof.

First claim

Opening claim text (preview).

What is claimed is: 1. A wired circuit board comprising: a metal supporting layer; an insulating base layer that is formed on the metal supporting layer; a conductive pattern that is formed on a surface of the insulating base layer; and an insulating cover layer formed on the insulating base layer so as to cover the conductive pattern, wherein the arithmetic average roughness Ra (JIS B 0601-1994) of the surface of the insulating base layer at least other than a portion whe…

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What does patent US9084359B2 cover?
A method for producing a wired circuit board includes the steps of preparing a metal supporting layer; forming an insulating layer on the metal supporting layer; roughening the surface of the insulating layer; forming a conductive pattern on the insulating layer; and inspecting the presence or absence of a defect of the conductive pattern by using an inspection device provided with a light emit…
Who is the assignee on this patent?
Okamoto Norihiko, Nitto Denko Corp
What technology area does this patent fall under?
Primary CPC classification G11B5/4833. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 14 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).