Temperature compensated RF peak detector

Patent metadata

Field	Value
Publication number	US-9077445-B2
Application number	US-201313939076-A
Country	US
Kind code	B2
Filing date	Jul 10, 2013
Priority date	Jul 10, 2013
Publication date	Jul 7, 2015
Grant date	Jul 7, 2015

Abstract

A temperature compensated RF peak detector is disclosed. In an exemplary embodiment, an apparatus includes a first RF peak detector configured to generate a reference signal, a temperature compensated threshold generator configured to generate a temperature compensated detection threshold based on the reference signal, and a comparator configured to generate a peak detection output based on the temperature compensated detection threshold.

First claim

What is claimed is:

1. An apparatus comprising:
a first radio frequency (RF) peak detector configured to generate a reference signal;
a temperature compensated threshold generator coupled to the first RF peak detector and configured to generate a temperature compensated detection threshold based on the reference signal generated by the first RF peak detector; and
a comparator configured to generate a peak detection output based on the temperature compensated detection threshold.

2. The apparatus of claim 1 , the comparator configured to generate the peak detection output based on a comparison of the temperature compensated detection threshold and a peak detection signal generated by a second RF peak detector.

3. The apparatus of claim 2 , further comprising an offset generator configured to receive the reference signal and to generate an offset reference signal based on the reference signal, the offset reference signal provided to the temperature compensated threshold generator.

4. The apparatus of claim 3 , the offset generator further configured to generate the offset reference signal to match an offset associated with the second RF peak detector.

5. The apparatus of claim 4 , the offset generator comprising a digital to analog converter (DAC) that generates the offset reference signal based on a digital control signal.

6. The apparatus of claim 1 , the temperature compensated threshold generator comprising a temperature compensated current source that generates a temperature compensated current.

7. The apparatus of claim 6 , the temperature compensated threshold generator further comprising a digital-to-analog converter (DAC) configured to generate the temperature compensated detection threshold based on the temperature compensated current and based on a digital control input.

8. The apparatus of claim 7 , wherein the temperature compensated detection threshold and the peak detection output have approximately equal variations with temperature.

9. The apparatus of claim 2 , wherein the first RF peak detector and the second RF peak detector are formed on an integrated circuit and are configured to have approximately equal process variations.

10. The apparatus of claim 1 , wherein the first RF peak detector is configured to generate the reference signal using an input terminal configured to receive a floating value or configured not to receive an RF signal.

11. The apparatus of claim 1 , wherein the peak detection output is provided to a processor configured to detect transmit power in a transmitter based on the peak detection output.

12. The apparatus of claim 1 , wherein the peak detection output is provided to a processor configured to detect jamming signal power in a receiver based on the peak detection output.

13. An apparatus comprising:
means for generating a reference signal;
means for generating a temperature compensated detection threshold based on the reference signal generated by the means for generating the reference signal, the means for generating the temperature compensated detection threshold coupled to the means for generating the reference signal; and
means for generating a peak detection output based on the temperature compensated detection threshold.

14. The apparatus of claim 13 , the means for generating the peak detection output configured to generate the peak detection output based on a comparison of the temperature compensated detection threshold and a peak detection signal generated by a means for generating a radio frequency (RF) peak detection signal.

15. The apparatus of claim 14 , further comprising means for generating an offset reference signal based on the reference signal, wherein the offset reference signal is provided to the means for generating the temperature compensated detection threshold.

16. The apparatus of claim 15 , the means for generating the offset reference signal configured to generate the offset reference signal to match an offset associated with the RF peak detection signal.

17. The apparatus of claim 14 , the means for generating the temperature compensated detection threshold comprising a digital-to-analog converter (DAC) configured to generate the temperature compensated detection threshold based on a temperature compensated current source and based on a digital control input.

18. The apparatus of claim 17 , wherein the temperature compensated detection threshold and the peak detection signal have approximately equal variations with temperature.

19. The apparatus of claim 13 , wherein the peak detection output is provided to a processor configured to detect transmit power in a transmitter based on the peak detection output or to detect jamming signal power in a receiver based on the peak detection output.

20. The apparatus of claim 1 , wherein the temperature compensated threshold generator is further configured to receive a control signal and to generate the temperature compensated detection threshold based on the reference signal and based on the control signal.

Assignees

• Qualcomm Inc

Inventors

• Rajavi Yashar
• Abdollahi-Alibeik Shahram

Classifications

• G01R21/01

  in circuits having distributed constants (G01R21/04, G01R21/07, G01R21/09, G01R21/12 take precedence) · CPC title

• H04B17/345

  Interference values ({signal-to-interference ratio [SIR] or carrier-to-interference ratio [CIR]} H04B17/336) · CPC title

• H04B17/16

  Test equipment located at the transmitter · CPC title

• H04B17/11

  for calibration · CPC title

• H04B17/104

  of other parameters, e.g. DC offset, delay or propagation times · CPC title