Touch panel apparatus and methods

Patent metadata

Field	Value
Publication number	US-9075477-B2
Application number	US-201313764661-A
Country	US
Kind code	B2
Filing date	Feb 11, 2013
Priority date	Feb 11, 2013
Publication date	Jul 7, 2015
Grant date	Jul 7, 2015

Abstract

Apparatus and methods process a set of calibration sample values acquired in response to a sequence of calibration touch events generated at known X-Y coordinate positions along a linear path across a touch panel surface. The set of calibration sample values is then curve-fitted to the path to create a characteristic model of the touch panel or a portion thereof. Run-time signals are acquired from X-Y nodes across the panel at the time of a touch event. One or more run-time signal values may be substituted into the panel characteristic model to determine a distance between an X-Y node most strongly associated with the run-time touch event and a point-of-projection of the touch event location onto the path.

First claim

What is claimed is:

1. An apparatus for improving touch panel accuracy, comprising:
a calibration sampling controller to command an X-Y coordinate positioning apparatus to position a touch-emulating stylus at a known X-Y coordinate position relative to a touch panel and to depress the stylus;
a touch sampling module communicatively coupled to the calibration sampling controller to receive, sample and store a plurality of calibration sample values, each calibration sample value c…

Assignees

• Texas Instruments Inc

Inventors

• Snedeker Michael Douglas

Classifications

• G06F3/0418 Primary

  Physics · mapped topic

• G06F3/0488

  Physics · mapped topic

• G06F3/041

  Physics · mapped topic

• G06F3/04144

  Physics · mapped topic

• G06F3/03545

  Physics · mapped topic