Method of fabricating dual trench isolated selective epitaxial diode array

Patent metadata

Field	Value
Publication number	US-9070620-B2
Application number	US-201414203500-A
Country	US
Kind code	B2
Filing date	Mar 10, 2014
Priority date	Oct 11, 2013
Publication date	Jun 30, 2015
Grant date	Jun 30, 2015

Abstract

Methods and devices associated with phase change memory include diodes operating as selector switches having a large driving current and high switching speed. A method of forming a semiconductor device includes providing a semiconductor substrate, defining a diode array region and a peripheral region on the semiconductor substrate, forming an N+ buried layer in the diode array region by performing an ion implantation process and an annealing process. The method also includes forming a semiconductor epitaxial layer on the N+ buried layer, forming deep trench isolations through the epitaxial layer and the N+ buried layer into a portion of the substrate in the first direction, and forming shallow trench isolations in the diode array region and in the peripheral region in the second direction. The shallow trench isolation has a depth equal to or greater than a thickness of the epitaxial layer.

First claim

What is claimed is:

1. A method of manufacturing a semiconductor device, the method comprising:
providing a p-type semiconductor substrate;
defining a diode array region and a peripheral device region on the p-type semiconductor substrate, wherein defining the diode array region and the peripheral device region on the p-type semiconductor substrate comprising:
forming a groove having sidewalls and a bottom in the p-type semiconductor substrate as the diode array region and a region outside the groove as the peripheral device region;
forming a N+ buried layer in the diode array region by performing an ion implantation process and an annealing process;
forming a semiconductor epitaxial layer on the N+ buried layer;
forming a deep trench isolation through the semiconductor epitaxial layer and the N+ buried layer into a portion of the p-type semiconductor substrate in a first direction;
forming a shallow trench isolation in the diode array region in a second direction and a shallow trench isolation in the peripheral region in the second direction, the shallow trench isolation having a depth equal to or greater than a thickness of the semiconductor epitaxial layer;
forming a N-well region in the p-type semiconductor substrate and a gate electrode of a CMOS device in the peripheral region;
forming a source and a drain of the CMOS device in the N-well region;
forming a P+ layer in the semiconductor epitaxial layer; and
forming N+ contact regions in the diode array region and in the peripheral device region.

2. The method of claim 1 , wherein the groove has a depth in a range between 100 nm and 600 nm, and the sidewalls intercept the bottom at an angle between 80 and 90 degrees.

3. The method of claim 1 , wherein performing an ion implantation process and an annealing process comprises:
forming a lightly doped P-type material on a portion of the diode array region;
forming a heavily doped N-type material on the portion of the diode array region; and
activating the lightly doped P-type material and the heavily doped N-type material by annealing to form the N+ buried layer.

4. The method of claim 3 , wherein the lightly doped P-type material comprises B, BF2, or any combinations thereof; and the heavily doped N-type material comprises As, P, Sb, or any combinations thereof; and
the annealing is at a temperature between 950° C. and 1150° C. and with a time duration between 10 seconds and 7200 seconds.

5. The method of claim 1 , wherein forming the semiconductor epitaxial layer comprises a deposition process at a temperature in a range between 950° C. and 1100° C. and with dimethyl dichlorosilane as a reaction gas.

6. The method of claim 1 , wherein forming the semiconductor epitaxial layer comprises a deposition process at a temperature in a range between 500° C. and 900° C. and with silane or dimethyl dichlorosilane as a reaction gas.

7. The method of claim 1 , wherein the deep trench isolation comprises undoped polysilicon layer and an oxide layer on the undoped polysilicon layer.

8. The method of claim 1 , forming the deep trench isolation comprises:
concurrently surrounding the diode array region with the deep trench isolation to isolate the diode array region from the peripheral region.

9. The method of claim 1 , wherein the shallow trench isolation in the diode array region and the shallow trench isolation in the peripheral are concurrently formed.

10. The method of claim 1 , further comprising, after forming the shallow trench isolation and prior to forming the P+ layer in the semiconductor epitaxial layer:
forming an N-type layer disposed between the N+ buried layer at a bottom and the P+ layer at a top.

11. The method of claim 10 , wherein the N-type layer is formed by implanting an N− dopant into the semiconductor epitaxial layer or by diffusing the N+ buried layer.

12. The method of claim 10 , wherein the source and the drain of the CMOS device is formed concurrently with forming a P+ in the semiconductor epitaxial layer or the source and the drain of the CMOS device is formed concurrently with forming the N+ buried layer in the diode array region.

13. The method of claim 1 , wherein the P+ layer is a shallow junction.

14. The method of claim 1 , further comprising:
forming a bit line and a word line;
connecting the bit line with the P+ layer; and
connecting the word line with the N+ buried layer.

Assignees

• Semiconductor Mfg Int Shanghai

Inventors

• Zhang Chao

Classifications

• H10W10/041 Primary

  of isolation regions comprising polycrystalline semiconductor materials · CPC title

• H10W10/40

  Isolation regions comprising polycrystalline semiconductor materials · CPC title

• H10W10/17

  formed using trench refilling with dielectric materials, e.g. shallow trench isolations · CPC title

• H10W10/014

  using trench refilling with dielectric materials, e.g. shallow trench isolations · CPC title

• H10D84/811

  Combinations of field-effect devices and one or more diodes, capacitors or resistors · CPC title