Electronic package module and method for fabrication of the same
US-2024413067-A1 · Dec 12, 2024 · US
US9064883B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9064883-B2 |
| Application number | US-201113218265-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 25, 2011 |
| Priority date | Aug 25, 2011 |
| Publication date | Jun 23, 2015 |
| Grant date | Jun 23, 2015 |
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A method of manufacturing a device includes providing a semiconductor chip having a first face and a second face opposite to the first face with a contact pad arranged on the first face. The semiconductor chip is placed on a carrier with the first face facing the carrier. The semiconductor chip is encapsulated with an encapsulation material. The carrier is removed and the semiconductor material is removed from the second face of the first semiconductor chip without removing encapsulation material at the same time.
Opening claim text (preview).
What is claimed is: 1. A device, comprising: a semiconductor chip having a first face and a second face opposite to the first face, wherein a contact pad is arranged within the semiconductor chip at the first face thereof, wherein the contact pad has a contact surface coplanar with the first face of the semiconductor chip and an opposing surface, opposite the contact surface, facing toward the second face of the semiconductor chip, and wherein the contact pad provides an electrical coupling at the contact surface thereof for an element external to the semiconductor chip with an integrated circuit of the semiconductor chip; and an encapsulation material having a first face and a second face opposite to the first face, wherein the encapsulating material encapsulates the semiconductor chip, wherein the first face of the semiconductor chip and the first face of the encapsulation material are co-planar thereby defining a plane, wherein the first face of the semiconductor chip is exposed from the encapsulation material, and wherein the second face of the semiconductor chip is also exposed from the encapsulation material, wherein the second face of the semiconductor chip and the second face of the encapsulation material have a height difference in the range from 3 to 10 μm, and wherein a thickness of the semiconductor chip is smaller than a thickness of the encapsulation material. 2. The device of claim 1 , wherein the second face of the semiconductor chip is exposed from the encapsulation material. 3. The device of claim 1 , wherein the encapsulation material covers side faces of the semiconductor chip. 4. The device of claim 1 , wherein a redistribution layer is arranged on the plane defined by the first face of the semiconductor chip and the first face of the encapsulation material. 5. The device of claim 4 , wherein the redistribution layer extends beyond an outline of the semiconductor chip. 6. The device of claim 1 , wherein the difference between a thickness of the semiconductor chip and a thickness of the encapsulation material is equal to the height difference between the second face of the semiconductor chip and the second face of the encapsulation material. 7. The device of claim 1 , wherein the encapsulation material is homogenous and entirely made of the same material.
the encapsulations exposing the passive side of the semiconductor body · CPC title
On different surfaces · CPC title
Bond pads specially adapted therefor · CPC title
Bond pads being integral with underlying chip-level interconnections · CPC title
on encapsulations · CPC title
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