Apparatus, method and system for performing phase-resolved optical frequency domain imaging

Patent metadata

Field	Value
Publication number	US-9060689-B2
Application number	US-44599006-A
Country	US
Kind code	B2
Filing date	Jun 1, 2006
Priority date	Jun 1, 2005
Publication date	Jun 23, 2015
Grant date	Jun 23, 2015

Abstract

Apparatus, system and method are provided which utilize signals received from a reference and a sample. In particular, a radiation is provided which includes at least one first electro-magnetic radiation directed to the sample and at least one second electro-magnetic radiation directed to the reference. A frequency of the radiation varies over time. An interference can be detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. It is possible to obtain a particular signal associated with at least one phase of at least one frequency component of the interference, and compare the particular signal to at least one particular information. Further, it is possible to receive at least one portion of the radiation and provide a further radiation, such that the particular signal can be calibrated based on the further signal.

First claim

What is claimed is:

1. An apparatus comprising:
at least one hardware first arrangement including a source which provides a radiation which includes at least one first electro-magnetic radiation directed to a sample and at least one second electro-magnetic radiation directed to a reference, wherein a frequency of the radiation provided by the at least one first arrangement varies over time; and
at least one hardware second arrangement which includes a detector that detects a particular interference signal between at least one third radiation associated with the at least one first radiation and at least one fourth radiation associated with the at least one second radiation,
wherein that particular interference signal is detected by the detector across a first radiation frequency range,
wherein the at least one second arrangement obtains at least one first phase of at least one frequency component of the particular interference signal, and wherein the at least one second arrangement includes a hardware computing arrangement which compares the at least one first phase with at least one second phase of at least one frequency component of a previously-detected interference signal which is detected by the detector across a second radiation frequency range, and
wherein the hardware computing arrangement generates at least one image of at least one portion of the sample that substantially excludes information caused by a difference between the first and second radiation frequency ranges based on the comparison and as function of the interference signals.

2. The apparatus according to claim 1 , wherein the at least one second arrangement is configured to determine a signal associated with at least one further phase of at least one further frequency component of a further interference signal, and wherein the at least one second phase is associated with the signal.

3. The apparatus according to claim 1 ,
wherein the at least one second arrangement is configured to determine a signal associated with at least one further phase of a further interference signal, the further interference signal being different from the particular and previously-detected interferences.

4. The apparatus according to claim 3 , wherein the at least one second arrangement obtains the particular and previously-detected interference signals at different times.

5. The apparatus according to claim 3 , wherein the at least one second arrangement obtains the particular and previously-detected interference signals at different locations of the sample.

6. The apparatus according to claim 1 , comprising a further reference configure to receive at least one portion of the radiation and provide a further radiation so as to generate a signal, wherein at least one of the signal or the at least second phase is associated with the further radiation.

7. The apparatus according to claim 6 , wherein the at least one second arrangement is configured to calibrate the at least one first phase based on the signal.

8. The apparatus according to claim 7 , wherein the calibration is based on at least one of an actual distance or an optical distance between the sample and the first arrangement.

9. The apparatus according to claim 1 , wherein the at least one second arrangement is configured to calibrate the signal based on at least one of an actual distance or an optical distance between the sample and the first arrangement.

10. The apparatus according to claim 1 , further comprising:
at least one hardware third arrangement including a further reference which receives at least one portion of the radiation and provides a further radiation which is at least partially based on the radiation, wherein the hardware computing arrangement induces a phase shift of the particular phase based on the further radiation, and wherein the further radiation is independent of any property of the sample.

11. The apparatus according to claim 10 , wherein the at least one hardware third arrangement is provided in the sample arm.

12. The method according to claim 10 , wherein the reference includes a mirror that is positioned to directly reflect the at least one portion to the at least one second arrangement.

13. The apparatus according to claim 10 , wherein the further radiation is distinct from the at least one second radiation and the at least one fourth radiation.

14. The apparatus according to claim 10 , wherein the at least one first arrangement includes a single laser source which generates the radiation.

15. The apparatus according to claim 10 , wherein the computing arrangement induces the phase shift at least one of digitally or mathematically.

16. The apparatus according to claim 1 , wherein the at least one second arrangement detects a further signal corresponding to a further interference signal between the at least one second and third radiations, and wherein the further signal is associated with at least one phase of at least one frequency component of an additional interference associated with the further signal.

17. The apparatus according to claim 1 , wherein the at least one second arrangement determines image information based on the comparison between the first and second phases.

18. A method comprising:
providing a radiation which includes at least one first electro-magnetic radiation directed to a sample and at least one second electro-magnetic radiation directed to a reference, wherein a frequency of the radiation varies over time;
detecting a particular interference signal between at least one third radiation associated with the at least one first radiation and at least one fourth radiation associated with the at least one second radiation, wherein the particular interference signal is detected across a first radiation frequency range;
obtaining at least one first phase of at least one frequency component of the particular interference signal; and
with a hardware computer arrangement, comparing the at least one first phase with at least one second phase of at least one frequency component of a previously-detected interference signal which is detected by across a second radiation frequency range, and
with the hardware computer arrangement, generating at least one image of at least one portion of the sample that substantially excludes information caused by a difference between the first and second radiation frequency ranges based on the comparison and as function of the interference signals.

19. The method according to claim 18 , further comprising determining a signal associated with at least one further phase of a further interference signal, the further interference signal being different from the particular and previously-detected interference signals.

20. The method according to claim 18 , further comprising:
determining a signal associated with at least one further phase of a further interference signal, the further interference signal being different from the particular and previously-detected interference signals.

21. The method according to claim 20 , further comprising obtaining the particular and previously-detected interference signals at different times.

22. The method according to claim 20 , further comprising obtaining the particular and previously-detected interference signals at different locations of the sample.

23. The method according to claim 18 , further comprising:
receiving at least one portion of the radiation and provide a further radiation so as to generate a signal, wherein at least on

Assignees

• Tearney Guillermo J
• Bouma Brett Eugene
• De Boer Johannes F
• Vakoc Benjamin J
• Yun Seok-Hyun
• Gen Hospital Corp

Inventors

• Tearney Guillermo J
• Bouma Brett Eugene
• De Boer Johannes F
• Vakoc Benjamin J
• Yun Seok-Hyun

Classifications

• A61B5/0073 Primary

  by tomography, i.e. reconstruction of 3D images from 2D projections (A61B5/0066 takes precedence) · CPC title

• A61B5/0066

  Optical coherence imaging · CPC title

• G01N21/45

  using interferometric methods; using Schlieren methods · CPC title

• A61B2560/0223

  of calibration, e.g. protocols for calibrating sensors · CPC title

• G01N21/4795

  spatially resolved investigating of object in scattering medium (in vivo A61B) · CPC title