Integrated circuit with electrostatic discharge protection
US-2024395801-A1 · Nov 28, 2024 · US
US9058992B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9058992-B2 |
| Application number | US-201313968950-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 16, 2013 |
| Priority date | Jun 13, 2013 |
| Publication date | Jun 16, 2015 |
| Grant date | Jun 16, 2015 |
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A structure includes a fin having first end and second ends and a substantially intrinsic portion between the first and second ends. The structure further includes a first region of doped semiconductor material disposed on the first end of the fin and a second region of doped semiconductor material disposed on the second end of the fin. The first region has one of the same doping polarity or an opposite doping polarity as the second region. The structure also includes a third region of doped semiconductor material disposed on the intermediate portion of the fin adjacent to the first region and the second region. The third region has a doping polarity that differs from the doping polarity of at least one of the first and second regions and forms a p-n junction with the at least one of the first and second regions.
Opening claim text (preview).
What is claimed is: 1. A structure, comprising: a semiconductor fin having a first end having a first doping polarity and a second end having the same doping polarity as the first end, the fin further comprising a substantially intrinsic portion in an intermediate portion of the fin between the first end and the second end; a first region of doped semiconductor material disposed on the first end of the fin and a second region of doped semiconductor material disposed on the secon…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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