Method for repairing driver circuit structure

US9057922B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9057922-B2
Application numberUS-201313922784-A
CountryUS
Kind codeB2
Filing dateJun 20, 2013
Priority dateJun 15, 2009
Publication dateJun 16, 2015
Grant dateJun 16, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Disclosed is a driver circuit structure integrated in a display panel. The driver circuit structure includes a plurality of transistors and a backup transistor. After completing the driver circuit structure, the disclosure inspects it to find an inactive transistor. The inspection process first, isolates the electrical connection between the inactive transistor and the first electrode line and/or the electrical connection between the inactive transistor and the second electrode line. Next, the source electrode of the backup transistor and the first electrode line and/or electrically connecting the drain electrode of the backup transistor and the second electrode line are electrical connected.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for repairing a driver circuit structure, comprising: inspecting the driver circuit structure to find an inactive transistor; electrically isolating the connection between the inactive transistor and the first electrode line and/or the connection between the inactive transistor and the second electrode line; and electrically connecting a backup transistor source electrode and the first electrode line and/or electrically connecting a backup trans…

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What does patent US9057922B2 cover?
Disclosed is a driver circuit structure integrated in a display panel. The driver circuit structure includes a plurality of transistors and a backup transistor. After completing the driver circuit structure, the disclosure inspects it to find an inactive transistor. The inspection process first, isolates the electrical connection between the inactive transistor and the first electrode line and/…
Who is the assignee on this patent?
Au Optronics Corp
What technology area does this patent fall under?
Primary CPC classification G09G3/006. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 16 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).