Systems and methods of testing memory devices
US-2024387303-A1 · Nov 21, 2024 · US
US9048201B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9048201-B2 |
| Application number | US-201113167152-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 23, 2011 |
| Priority date | Jun 23, 2011 |
| Publication date | Jun 2, 2015 |
| Grant date | Jun 2, 2015 |
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The disclosure is directed to a semiconductor wafer, integrated circuit product, and method of making same, having multiple non-singulated chips separated by scribe lines, comprising a plurality of seal rings, each seal ring surrounding a corresponding chip and disposed between the corresponding chip and adjacent scribe lines. Well resistors are disposed below the seal rings and probe pads disposed in the scribe lines. In particular, at least one of the probe pads is coupled by at least one of the well resistors to at least one of the chips.
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What is claimed is: 1. A semiconductor wafer having multiple non-singulated chips separated by scribe lines, comprising: a plurality of seal rings disposed on a surface of a semiconductor substrate, each seal ring surrounding a corresponding chip and disposed between the corresponding chip and adjacent scribe lines; probe pads disposed in the scribe lines; and a plurality of doped regions disposed in the semiconductor substrate, each of the plurality of doped regions configure…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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Electricity · mapped topic
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