Method for operating a projection exposure apparatus with correction of imaging aberrations induced by the mask

US9041908B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9041908-B2
Application numberUS-201213555785-A
CountryUS
Kind codeB2
Filing dateJul 23, 2012
Priority dateMar 30, 2010
Publication dateMay 26, 2015
Grant dateMay 26, 2015

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Abstract

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The disclosure relates to a method for adapting a projection exposure apparatus for microlithography to a mask having structures with different pitches and/or different structure widths in different structure directions. Wavefront aberrations induced by the mask are reduced by a manipulator of the projection exposure apparatus for microlithography.

First claim

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What is claimed is: 1. A method, comprising: providing a microlithography projection exposure apparatus, comprising: an illumination system to illuminate a mask with illumination light and to produce different illumination settings, the mask having a plurality of different pitches and/or structure widths in different structure directions of the mask; and an objective to image the mask situated in an object plane of the objective onto an object situated in an image plane of the…

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What does patent US9041908B2 cover?
The disclosure relates to a method for adapting a projection exposure apparatus for microlithography to a mask having structures with different pitches and/or different structure widths in different structure directions. Wavefront aberrations induced by the mask are reduced by a manipulator of the projection exposure apparatus for microlithography.
Who is the assignee on this patent?
Ruoff Johannes, Zeiss Carl Smt Gmbh
What technology area does this patent fall under?
Primary CPC classification G03F7/70283. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 26 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).