Ion guide with orthogonal sampling

Patent metadata

Field	Value
Publication number	US-9035246-B2
Application number	US-201414245292-A
Country	US
Kind code	B2
Filing date	Apr 4, 2014
Priority date	Mar 14, 2011
Publication date	May 19, 2015
Grant date	May 19, 2015

Abstract

A mass spectrometer is disclosed comprising a RF ion guide wherein in a mode of operation a continuous, quasi-continuous or pulsed beam of ions is orthogonally sampled from the ion guide and wherein the continuous, quasi-continuous or pulsed beam of ions is not axially trapped or otherwise axially confined within the RF ion guide. The ion guide is maintained, in use, at a pressure selected from the group consisting of: (i) 0.0001-0.001 mbar; (ii) 0.001-0.01 mbar; (iii) 0.01-0.1 mbar; (iv) 0.1-1 mbar; (v) 1-10 mbar; (vi) 10-100 mbar; and (vii) >100 mbar.

First claim

The invention claimed is:

1. A mass spectrometer comprising:
an RF ion guide comprising a plurality of electrodes wherein in a mode of operation ions are orthogonally sampled from said ion guide and wherein said ions are not axially trapped or otherwise axially confined within said RF ion guide;
a device arranged and adapted to apply an AC or RF voltage to said electrodes in order to confine ions within said ion guide in a first direction (y); and
a control system, wherein sai…

Assignees

• Micromass Ltd

Inventors

• Green Martin Raymond
• Langridge David J
• Wildgoose Jason Lee

Classifications

• H01J49/063 Primary

  Electricity · mapped topic

• H01J49/065 Primary

  Electricity · mapped topic

• H01J49/022

  Electricity · mapped topic

• H01J49/36

  Electricity · mapped topic

• H01J49/062

  Electricity · mapped topic