Systems and methods for reconstructing 3d surfaces of tubular lumens
US-2015377613-A1 · Dec 31, 2015 · US
Device for analysing the surface of a substrate
US9030554B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9030554-B2 |
| Application number | US-200913122091-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 29, 2009 |
| Priority date | Oct 1, 2008 |
| Publication date | May 12, 2015 |
| Grant date | May 12, 2015 |
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Abstract
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An analysis device for analysing a transparent or specular surface of a substrate, the device including a raster located opposite the surface of the substrate to be measured, a video camera for capturing at least one image of the raster deformed by the measured substrate, a raster lighting system, and an image-processing and digital analysis mechanism connected to the video camera. The video camera is a matrix array camera, the raster is provided on a substrate having an oblong shape and is bidirectional including a first pattern extending along a first direction and along a smallest extension of the substrate, the first pattern being transversely periodical to the smallest extension, and a second pattern extending in a second direction perpendicular to the first pattern and along a largest extension of the substrate.
First claim
Opening claim text (preview).
The invention claimed is: 1. A device for analysing a transparent or specular surface of a substrate comprising: a reference pattern facing the surface of the substrate to be measured and placed on a support with an oblong shape of shorter and longer extents, the reference pattern being bidirectional and including a first pattern that lies along a first direction and along the shorter extent of the support, the first pattern being periodic transverse to the shorter extent, and inc…
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Physics · mapped topic
Physics · mapped topic
- G01B11/2513Primary
Physics · mapped topic
Physics · mapped topic
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- What does patent US9030554B2 cover?
- An analysis device for analysing a transparent or specular surface of a substrate, the device including a raster located opposite the surface of the substrate to be measured, a video camera for capturing at least one image of the raster deformed by the measured substrate, a raster lighting system, and an image-processing and digital analysis mechanism connected to the video camera. The video ca…
- Who is the assignee on this patent?
- Pichon Michel, Davenne Franc, Saint Gobain
- What technology area does this patent fall under?
- Primary CPC classification G01B11/2513. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue May 12 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).