Method and circuit of an actively transmitting tag
US-2015347892-A1 · Dec 3, 2015 · US
Semiconductor wafer and method for auto-calibrating integrated circuit chips using PLL at wafer level
US9030217B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9030217-B2 |
| Application number | US-201213605554-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 6, 2012 |
| Priority date | Apr 23, 2012 |
| Publication date | May 12, 2015 |
| Grant date | May 12, 2015 |
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Abstract
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In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; calculating a difference between a phase of the operation frequency and a phase of a calibration target frequency; generating a frequency calibration value of the operation frequency using the phase difference; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.
First claim
Opening claim text (preview).
What is claimed is: 1. A method of auto-calibrating integrated circuit chips at a wafer level by calibrating an operation frequency of the integrated circuit chips, the method comprising: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip on which to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; calculating a difference between a phase of the ope…
Assignees
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Classifications
- G06K19/0726Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
- H03L7/00Primary
Electricity · mapped topic
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Frequently asked questions
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- What does patent US9030217B2 cover?
- In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit c…
- Who is the assignee on this patent?
- Kim Hyunseok, Choi Su Na, Lee Heyung Sub, and 2 more
- What technology area does this patent fall under?
- Primary CPC classification G06K19/0726. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue May 12 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).