Image examination apparatus, image examination system, and image examination method

US9019526B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9019526-B2
Application numberUS-201414191935-A
CountryUS
Kind codeB2
Filing dateFeb 27, 2014
Priority dateMar 15, 2013
Publication dateApr 28, 2015
Grant dateApr 28, 2015

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation unit configured to calculate information on misalignment between positions of the reference points and positions corresponding respectively to the reference points in the read image; an excluding unit configured to exclude a reference point from the multiple reference points, based on the information on misalignment; an alignment unit configured to perform alignment between the examination and read images based on the reference points other than the excluded reference point; and an examination unit configured to perform examination for determining whether there is a defect in the read image on the basis of a difference between the read and examination images.

First claim

Opening claim text (preview).

What is claimed is: 1. An image examination apparatus, comprising: a read image acquisition unit configured to acquire a read image that is generated by reading an image formed on a recording medium; an examination image generation unit configured to generate an examination image for examining the read image on the basis of information on the image that is to be formed and output; a reference point extraction unit configured to extract, from the generated examination image, mu…

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Next steps

Free tools are coming soon. Tell us what you want to track and we'll notify you.

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9019526B2 cover?
An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation unit configured to calculate information on misalignment between positions of the reference point…
Who is the assignee on this patent?
Fukase Takahiro, Kitai Tadashi, Ricoh Co Ltd
What technology area does this patent fall under?
Primary CPC classification G06K15/027. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 28 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).