Electrical voltage measuring device using an microelectromechanical system and optical interferometer interaction
US-2024219431-A1 · Jul 4, 2024 · US
US9018937B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9018937-B2 |
| Application number | US-201213352219-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 17, 2012 |
| Priority date | Jan 17, 2012 |
| Publication date | Apr 28, 2015 |
| Grant date | Apr 28, 2015 |
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An electromechanical system (MEMS) voltmeter. An exemplary MEMS voltmeter includes a proof mass mounted to a substrate in a teeter-totter manner. The MEMS voltmeter also includes an input voltage plate located on the substrate under a first end of the proof mass. The first input voltage plate receives a voltage from a device under test. A drive voltage plate is located on the substrate under a second end of the proof mass. A first sense input voltage plate is located on the substrate under the first end of the proof mass. A second sense voltage plate is located on the substrate under the second end of the proof mass. A rebalancing circuit receives signals from the proof mass and the first and second sense voltage plates and generates a voltage value that is equal to the root mean square (RMS) voltage of the device under test.
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The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows: 1. A voltmeter comprising: a proof mass electrically coupled to an effective ground; an input voltage plate located on a substrate adjacent a first end of the proof mass, wherein the input voltage plate is configured to receive a voltage from a device under test; a drive voltage plate located on the substrate adjacent a second end of the proof mass; a sensing devic…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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