Purified surface region of an oxide semiconductor, and method of near-surface purification
US-2024355884-A1 · Oct 24, 2024 · US
US9018735B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9018735-B2 |
| Application number | US-201313917117-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 13, 2013 |
| Priority date | Sep 29, 2008 |
| Publication date | Apr 28, 2015 |
| Grant date | Apr 28, 2015 |
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A silicon wafer and fabrication method thereof are provided. The silicon wafer includes a first denuded zone formed with a predetermined depth from a top surface of the silicon wafer, the first denuded zone being formed with a depth ranging from approximately 20 μm to approximately 80 μm from the top surface, and a bulk area formed between the first denuded zone and a backside of the silicon wafer, the bulk area having a concentration of oxygen uniformly distributed within a variation of 10% over the bulk area.
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What is claimed is: 1. A silicon wafer, comprising: a first denuded zone formed with a depth ranging from approximately 20 μm to approximately 80 μm from a top surface of the silicon wafer; and a bulk area formed between the first denuded zone and a backside of the silicon wafer, the bulk area having a concentration of oxygen within a range from approximately 10.5 to approximately 13 ppma (parts per million atom) uniformly distributed within a variation of 10% over the bulk area…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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