Semiconductor memory device

US9018682B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9018682-B2
Application numberUS-201314143077-A
CountryUS
Kind codeB2
Filing dateDec 30, 2013
Priority dateJun 12, 2013
Publication dateApr 28, 2015
Grant dateApr 28, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

According to one embodiment, a semiconductor memory device includes a stacked body including a plurality of electrode layers stacked alternately with a plurality of insulating layers on the substrate, a channel body provided inside a hole piercing the stacked body, and a memory portion provided between the channel body and each of the plurality of electrode layers. The hole has a large diameter portion and a small diameter portion. The diameter of the hole is smaller at the small diameter portion than at the large diameter portion. A thickness of the electrode layer adjacent to the small diameter portion is thicker than a thickness of the electrode layer adjacent to the large diameter portion.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor memory device, comprising: a substrate; a stacked body including a plurality of electrode layers stacked alternately with a plurality of insulating layers on the substrate; a channel body provided inside a hole piercing the stacked body, the channel body extending in a stacking direction of the stacked body; and a memory portion provided between the channel body and each of the plurality of electrode layers; the hole having a large di…

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What does patent US9018682B2 cover?
According to one embodiment, a semiconductor memory device includes a stacked body including a plurality of electrode layers stacked alternately with a plurality of insulating layers on the substrate, a channel body provided inside a hole piercing the stacked body, and a memory portion provided between the channel body and each of the plurality of electrode layers. The hole has a large diameter…
Who is the assignee on this patent?
Toshiba Kk
What technology area does this patent fall under?
Primary CPC classification H10D30/693. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 28 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).