Integrated photodetector waveguide structure with alignment tolerance
US-2015364619-A1 · Dec 17, 2015 · US
US9018033B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9018033-B2 |
| Application number | US-201314061422-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 23, 2013 |
| Priority date | Sep 30, 2011 |
| Publication date | Apr 28, 2015 |
| Grant date | Apr 28, 2015 |
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A method of manufacturing solar cells is disclosed. The method comprises depositing an etch-resistant dopant material on a silicon substrate, the etch-resistant dopant material comprising a dopant source, forming a cross-linked matrix in the etch-resistant dopant material using a non-thermal cure of the etch-resistant dopant material, and heating the silicon substrate and the etch-resistant dopant material to a temperature sufficient to cause the dopant source to diffuse into the silicon substrate.
Opening claim text (preview).
What is claimed is: 1. A method of manufacturing solar cells, the method comprising: forming a thin dielectric layer on a surface of a silicon substrate; forming a polysilicon layer over the thin dielectric layer; depositing, in liquid phase, an etch-resistant dopant material comprising a dopant source material and a solvent on the polysilicon layer; forming a cross-linked matrix in the etch-resistant dopant material using a non-thermal cure of the etch-resistant dopant material, the cross-linked matrix having a structure, and the non-thermal cure causing a phase change of the etch-resistant dopant material from liquid to solid; subsequently, removing the solvent from the etch-resistant dopant material without altering the structure of the cross-linked matrix; and heating the etch-resistant dopant material to a temperature wherein the dopant source material diffuses into the polysilicon layer. 2. The method of claim 1 , further comprising the step of etching the polysilicon layer using the etch-resistant dopant material as an etchmask. 3. The method of claim 1 , wherein depositing the etch-resistant dopant material comprises dispensing the etch-resistant dopant material in a plurality of interdigitated contact fingers on the silicon substrate. 4. A method of manufacturing solar cells, the method comprising: depositing, in a liquid phase, an etch-resistant dopant material on a polysilicon layer disposed on a thin dielectric layer disposed on a silicon substrate, the etch-resistant dopant material comprising a dopant source and a solvent; forming a cross-linked matrix in the etch-resistant dopant material using a non-thermal cure of the etch-resistant dopant material, the cross-linked matrix having a structure, and the non-thermal cure causing a phase change of the etch-resistant dopant material from liquid to solid; subsequently, removing the solvent from the etch-resistant dopant material without altering the structure of the cross-linked matrix; and heating the polysilicon layer and the etch-resistant dopant material having the cross-linked matrix to a temperature sufficient to cause the dopant source to diffuse into the polysilicon layer. 5. The method of claim 4 , wherein forming the cross-linked matrix in the etch-resistant dopant material using the non-thermal cure of the etch-resistant dopant material comprises exposing the etch-resistant dopant material to non-infrared electromagnetic radiation. 6. The method of claim 5 , wherein exposing the etch-resistant dopant material to the non-infrared electromagnetic radiation comprises exposing the etch-resistant dopant material to ultraviolet light. 7. The method of claim 5 , wherein exposing the etch-resistant dopant material to the non-infrared electromagnetic radiation comprises exposing the etch-resistant dopant material with light from the visible spectrum or electromagnetic radiation having a wavelength of 380 to 760 nanometers. 8. The method of claim 4 , wherein forming the cross-linked matrix in the etch-resistant dopant material using the non-thermal cure of the etch-resistant dopant material comprises transmitting acoustic waves toward the etch-resistant dopant material. 9. The method of claim 4 , wherein depositing the etch-resistant dopant material comprises dispensing the etch-resistant dopant on the polysilicon layer. 10. The method of claim 9 , wherein dispensing the etch-resistant dopant material comprises screen printing the etch-resistant dopant material onto the polysilicon layer. 11. The method of claim 9 , wherein dispensing the etch-resistant dopant material comprises ink-jet printing the etch-resistant dopant material onto the polysilicon layer. 12. The method of claim 9 , wherein dispensing the etch-resistant dopant material comprises spin coating the etch-resistant dopant material onto the polysilicon layer. 13. The method of claim 9 , wherein dispensing the etch-resistant dopant material comprising the dopant source onto the polysilicon layer comprises dispensing a dopant material comprising a single-polarity dopant source onto the polysilicon layer. 14. The method of claim 13 , wherein dispensing the dopant material comprising the single-polarity dopant source onto the polysilicon layer comprises dispensing a positive-type dopant onto the polysilicon layer. 15. The method of claim 13 , wherein dispensing the dopant material comprising the single-polarity dopant source onto the polysilicon layer comprises dispensing a negative-type dopant onto the polysilicon layer. 16. The method of claim 4 , wherein removing the solvent from the etch-resistant dopant material comprises heating the etch-resistant dopant material to at least 400° Celsius. 17. A method of manufacturing solar cells, the method comprising: depositing, in a liquid phase, a dopant material on a polysilicon layer disposed on a thin dielectric layer disposed on a silicon substrate having a photovoltaic solar cell structure, the dopant material comprising a dopant and a solvent; forming a cross-linked matrix in the dopant material using a non-thermal exposure of the dopant material to ultraviolet light through a photo-polymerization process, the cross-linked matrix having a structure, and the photo-polymerization process causing a phase change of the dopant material from liquid to solid; subsequently, removing the solvent from the dopant material without altering the structure of the cross-linked matrix; and heating the polysilicon layer and the dopant material having the cross-linked matrix to a temperature sufficient to cause the dopant to diffuse into the polysilicon layer. 18. The method of claim 17 , wherein forming the cross-linked matrix in the dopant material using the non-thermal exposure of the dopant material to the ultraviolet light comprises exposing the dopant material to electromagnetic radiation having a wavelength of 8 to 400 nanometers. 19. The method of claim 17 , wherein depositing the dopant material comprises depositing a chemical group comprising a chemical structure selected from the group comprising silanes, cyclosilanes, and siloxanes.
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