System for producing polycrystalline silicon, apparatus for producing polycrystalline silicon, and process for producing polycrystalline silicon

US9017482B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9017482-B2
Application numberUS-201013496060-A
CountryUS
Kind codeB2
Filing dateJul 20, 2010
Priority dateSep 14, 2009
Publication dateApr 28, 2015
Grant dateApr 28, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

The present invention provides a technique by which heat can be efficiently recovered from a coolant used to cool a reactor, and contamination with dopant impurities from an inner wall of a reactor when polycrystalline silicon is deposited within the reactor can be reduced to produce high-purity polycrystalline silicon. With the use of hot water 15 having a temperature higher than a standard boiling point as a coolant fed to the reactor 10, the temperature of the reactor inner wall is kept at a temperature of not more than 370° C. Additionally, the pressure of the hot water 15 to be recovered is reduced by a pressure control section provided in a coolant tank 20 to generate steam. Thereby, a part of the hot water is taken out as steam to the outside, and reused as a heating source for another application.

First claim

Opening claim text (preview).

The invention claimed is: 1. A system for producing polycrystalline silicon comprising: a reactor configured for producing polycrystalline silicon; a coolant tank configured for storing a coolant; a coolant circulation path configured for feeding the coolant from the coolant tank to the reactor and for recovering the coolant to the coolant tank through a coolant flow passage provided in the reactor; an energy recovering section configured for taking out, for recovery of ener…

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What does patent US9017482B2 cover?
The present invention provides a technique by which heat can be efficiently recovered from a coolant used to cool a reactor, and contamination with dopant impurities from an inner wall of a reactor when polycrystalline silicon is deposited within the reactor can be reduced to produce high-purity polycrystalline silicon. With the use of hot water 15 having a temperature higher than a standard …
Who is the assignee on this patent?
Netsu Shigeyoshi, Oguro Kyoji, Shimizu Takaaki, and 3 more
What technology area does this patent fall under?
Primary CPC classification H10P14/3456. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 28 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).