Latch Performance Detection Method, Device and Electronic Device
US-2024170092-A1 · May 23, 2024 · US
US9015539B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9015539-B2 |
| Application number | US-201313969259-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 16, 2013 |
| Priority date | Sep 3, 2010 |
| Publication date | Apr 21, 2015 |
| Grant date | Apr 21, 2015 |
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A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.
Opening claim text (preview).
I claim: 1. A method for testing a read-only memory (ROM) for at least one non stuck-at fault, the method comprising: reading an uncorrupted data value of a victim cell to generate a golden value; providing a fault-specific pattern through an aggressor cell, wherein the aggressor cell is associated with a plurality of victim cells; generating a test reading of the victim cell in response to the provided fault-specific pattern; and determining whether the ROM has at least one…
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