Method and apparatus for analyzing subsurfaces of a target material

Patent metadata

Field	Value
Publication number	US-9014792-B2
Application number	US-201313971950-A
Country	US
Kind code	B2
Filing date	Aug 21, 2013
Priority date	Nov 10, 2011
Publication date	Apr 21, 2015
Grant date	Apr 21, 2015

Abstract

A system that incorporates teachings of the present disclosure may include, for example, a method for aligning first and second light signals on an optical path directed to a target, where the first light signal provides a visualization of the target, and a portion of the second light signal reflects from at least one subsurface of the target. The method also includes aligning a first focal point of the first light signal and a second focal point of the second light signal, where the first focal point is at least in a first proximate location of the second focal point, and adjusting a first position of the first and second focal points to be in at least a second proximate location of the target without adjusting the at least first proximate location of the first focal point relative to the second focal point. Other embodiments are disclosed.

First claim

What is claimed is:

1. A device, comprising:
a first light source for emitting a first light signal operating in a first region of a light spectrum;
a second light source for emitting a second light signal operating in a second region of the light spectrum, wherein the first region and the second region differ; and
a first optical device providing a coaxial optical path of the first light signal and the second light signal,
wherein a relative position of the first optical de…

Assignees

• Welch Allyn Inc

Inventors

• Goldfain Ervin
• Lia Raymond A

Classifications

• A61B5/0066 Primary

  Human Necessities · mapped topic

• A61B5/0073

  Human Necessities · mapped topic

• G01B9/02091 Primary

  Physics · mapped topic

• Y10T29/49002

  Cross-Sectional Technologies · mapped topic

• A61B5/0084

  Human Necessities · mapped topic