Automated custom feature engineering
US-2024160999-A1 · May 16, 2024 · US
US9014490B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9014490-B2 |
| Application number | US-93196211-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 15, 2011 |
| Priority date | Feb 15, 2011 |
| Publication date | Apr 21, 2015 |
| Grant date | Apr 21, 2015 |
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A method for effectively performing local image similarity measurement is proposed. A system equipped with such a method for effectively performing an image processing task includes an image processor that performs an intermediate-results calculation procedure to calculate intermediate result values that are based upon corresponding pixels of a target patch and one or more similar patches. The image processor typically moves the target patch of the intermediate-results calculation to different locations in a raster order or some other organized order. The image processor then performs an intermediate-results combination procedure by calculating appropriate statistics of the intermediate result values to produce processed pixel values. A processor device typically controls the image processor to effectively perform the image processing tasks including, but not limited to, demosaicing and denoising.
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What is claimed is: 1. A method for effectively performing local image similarity measurement and a system equipped with such a method for performing an image processing task with an electronic device, comprising: an image processor that performs an intermediate-results calculation procedure to calculate intermediate result values that are based upon corresponding pixels of a target patch from a current image frame and similar patches from said current image frame, said image proc…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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