Object Pickup System and Method
US-2024101370-A1 · Mar 28, 2024 · US
Measurement apparatus, information processing apparatus, information processing method, and storage medium
US9014433B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9014433-B2 |
| Application number | US-201313738351-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 10, 2013 |
| Priority date | Jul 11, 2011 |
| Publication date | Apr 21, 2015 |
| Grant date | Apr 21, 2015 |
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Abstract
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A measurement apparatus includes a projection unit configured to project pattern light onto an object to be measured, an imaging unit configured to capture an image of the object to be measured on which the pattern light is projected to acquire a captured image of the object to be measured, a measurement unit configured to measure a position and/or orientation of the object to be measured on the basis of the captured image, a position and orientation of the projection unit, and a position and orientation of the imaging unit, a setting unit configured to set identification resolution of the pattern light using a range of variation in the position and/or orientation of the object to be measured; and a change unit configured to change a pattern shape of the pattern light in accordance with the identification resolution.
First claim
Opening claim text (preview).
The invention claimed is: 1. A measurement apparatus comprising: a holding unit configured to hold model information of a target object; an image obtaining unit configured to obtain an image including the target object; a first obtaining unit configured to obtain an approximate position and/or an orientation of the target object included in the image; a second obtaining unit configured to obtain a range of variation in the obtained approximate position and/or orientation of…
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Frequently asked questions
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- What does patent US9014433B2 cover?
- A measurement apparatus includes a projection unit configured to project pattern light onto an object to be measured, an imaging unit configured to capture an image of the object to be measured on which the pattern light is projected to acquire a captured image of the object to be measured, a measurement unit configured to measure a position and/or orientation of the object to be measured on th…
- Who is the assignee on this patent?
- Canon Kk
- What technology area does this patent fall under?
- Primary CPC classification G01B11/00. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Apr 21 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).