Testing of semiconductor chips with microbumps
US-2015362526-A1 · Dec 17, 2015 · US
Method of testing an object and apparatus for performing the same
US9013201B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9013201-B2 |
| Application number | US-201213534088-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 27, 2012 |
| Priority date | Nov 10, 2011 |
| Publication date | Apr 21, 2015 |
| Grant date | Apr 21, 2015 |
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Abstract
Official abstract text for this publication.
A method of testing objects and an apparatus for performing the same, the method including loading the objects into a testing unit through a loading unit; testing the objects in the testing unit and determining whether the objects are normal objects or abnormal objects; unloading the tested objects from the testing unit to an unloading unit; directly reversely loading the abnormal objects from the unloading unit into the testing unit when the objects are determined to be abnormal objects; and re-testing the abnormal objects in the testing unit.
First claim
Opening claim text (preview).
What is claimed is: 1. A method of testing an object, the method comprising: loading the objects into a testing unit through a loading unit; heating the objects before loading the objects into the testing unit; testing the objects in the testing unit and determining whether the objects are normal objects or abnormal objects; unloading the tested objects from the testing unit to an unloading unit; directly reversely loading the abnormal objects from the unloading unit into…
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Classifications
Electricity · mapped topic
- G01R31/2893Primary
Physics · mapped topic
- G01R31/26Primary
Physics · mapped topic
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Frequently asked questions
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- What does patent US9013201B2 cover?
- A method of testing objects and an apparatus for performing the same, the method including loading the objects into a testing unit through a loading unit; testing the objects in the testing unit and determining whether the objects are normal objects or abnormal objects; unloading the tested objects from the testing unit to an unloading unit; directly reversely loading the abnormal objects from …
- Who is the assignee on this patent?
- Park Jae-Ho, Um Tea-Seog, Kim In-Sik, and 3 more
- What technology area does this patent fall under?
- Primary CPC classification G01R31/2893. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Apr 21 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).