Semiconductor devices and methods of manufacturing
US-12166025-B2 · Dec 10, 2024 · US
US9013039B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9013039-B2 |
| Application number | US-201313959252-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 5, 2013 |
| Priority date | Aug 5, 2013 |
| Publication date | Apr 21, 2015 |
| Grant date | Apr 21, 2015 |
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Official abstract text for this publication.
A method for handling and supporting a device wafer during a wafer thinning process and the resulting device are provided. Embodiments include forming a plurality of solder bumps on a first surface of a substrate having a first and a second surface; removing a portion from a periphery of the first surface of the substrate; forming a temporary bonding material on a first carrier; bonding the first surface of the substrate with the temporary bonding material of the first carrier; affixing the second surface of the substrate to a second carrier; and removing the temporary bonding material.
Opening claim text (preview).
What is claimed is: 1. A method comprising: forming a plurality of solder bumps on a first surface of a substrate having a first and a second surface; removing a portion from only a periphery of the first surface of the substrate; forming a temporary bonding material on a periphery of a first carrier; bonding the first surface of the substrate with the temporary bonding material of the first carrier only along the periphery of the first surface of the substrate at the locati…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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