Method for evaluating polymer material

US9000367B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9000367-B2
Application numberUS-201213982616-A
CountryUS
Kind codeB2
Filing dateFeb 8, 2012
Priority dateFeb 8, 2011
Publication dateApr 7, 2015
Grant dateApr 7, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a method for evaluating a polymer material, wherein the state of dispersion of a filler in a polymer material can be quickly and quantitatively evaluated. The method for evaluating a polymer material which is a polymer material containing the polymer compound and the filler and of which at least an upper surface is a flat surface. The polymer material 1 is cut in a direction at an angle α of 1 to 60° with respect to the surface of the polymer material using a focused ion beam (FIB) 10 , and a smooth surface 1 A of the polymer material, formed by the cutting, is then photographed in a direction perpendicular to the smooth surface.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for evaluating a polymer material containing a polymer compound and a filler, of which at least an upper surface is a flat surface, the method comprising: cutting the upper surface of the polymer material in a direction at an angle of 1 to 60° with respect to the upper surface of the polymer material using a focused ion beam; and then photographing a smooth surface of the polymer material, formed by the cutting, in a direction perpendicular to the smooth surface, and wherein the filler is at least one selected from the group consisting of silicas, carbon blacks, and inorganic compounds represented by the following formula (I): m M. x SiO y.z H 2 O  (I) (wherein M is at least one selected from metals selected from the group consisting of aluminum, magnesium, titanium, calcium and zirconium, oxides or hydroxides of the metals and hydrates thereof, or carbonates of the metals; and m, x, y, and z are an integer of 1 to 5, an integer of 0 to 10, an integer of 2 to 5, and an integer of 0 to 10, respectively). 2. The method for evaluating a polymer material according to claim 1 , wherein the smooth surface of the polymer material is photographed using a scanning electron microscope. 3. The method for evaluating a polymer material according to claim 2 , wherein an image obtained by photographing the smooth surface of the polymer material is converted into a binarized image of a polymer compound section and a filler section, and the state of dispersion of the filler in the polymer material is evaluated based on the obtained binarized image. 4. The method for evaluating a polymer material according to claim 1 , wherein an image obtained by photographing the smooth surface of the polymer material is converted into a binarized image of a polymer compound section and a filler section, and the state of dispersion of the filler in the polymer material is evaluated based on the obtained binarized image.

Assignees

Inventors

Classifications

  • G01N1/286Primary

    involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising (microtomes G01N1/06; pulverising in general B02C; mixing in general B01F) · CPC title

  • Resins; Plastics · CPC title

  • G01N23/00Primary

    Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 · CPC title

  • using electron or ion · CPC title

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What does patent US9000367B2 cover?
Provided is a method for evaluating a polymer material, wherein the state of dispersion of a filler in a polymer material can be quickly and quantitatively evaluated. The method for evaluating a polymer material which is a polymer material containing the polymer compound and the filler and of which at least an upper surface is a flat surface. The polymer material 1 is cut in a direction…
Who is the assignee on this patent?
Nakamura Satoshi, KUROTANI Yuji, Tanabe Tatsuro, and 2 more
What technology area does this patent fall under?
Primary CPC classification G01N1/286. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 07 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).