Method for forming source/drain contacts
US-2024379814-A1 · Nov 14, 2024 · US
US8999826B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8999826-B2 |
| Application number | US-201313865691-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 18, 2013 |
| Priority date | Apr 27, 2007 |
| Publication date | Apr 7, 2015 |
| Grant date | Apr 7, 2015 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Method of producing a vertically inhomogeneous platinum or gold distribution in a semiconductor substrate with a first and a second surface opposite the first surface, with diffusing platinum or gold into the semiconductor substrate from one of the first and second surfaces of the semiconductor substrate, removing platinum- or gold-comprising residues remaining on the one of the first and second surfaces after diffusing the platinum or gold, forming a phosphorus- or boron-doped surface barrier layer on the first or second surface, and heating the semiconductor substrate for local gettering of the platinum or gold by the phosphorus- or boron-doped surface barrier layer.
Opening claim text (preview).
What is claimed is: 1. A semiconductor device having a thickness L, comprising: a p-doped region; an n-doped region; and a vertically inhomogeneous heavy metal doping profile comprising a first heavy metal doping concentration greater than C 1 across a first depth region of a thickness greater than L/6 and a second heavy metal doping concentration smaller than C 2 across a second depth region of a thickness greater than L/6, wherein C 1 >3×C 2 , wherein the semiconductor dev…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.