Method of fabricating an analyzer

Patent metadata

Field	Value
Publication number	US-8997331-B2
Application number	US-201213353387-A
Country	US
Kind code	B2
Filing date	Jan 19, 2012
Priority date	Dec 29, 2008
Publication date	Apr 7, 2015
Grant date	Apr 7, 2015

Abstract

A matrix analyzer for determining the size and location of a conductive item placed thereon. The matrix analyzer includes plural row conductors and column conductors with a corresponding grid of conductive areas exposed on the surface of the matrix analyzer. When a conductive item, such as an ink droplet, is jetted onto the matrix analyzer, the intersection of various row conductors and column conductors exhibit a low resistance. The rows and columns of the matrix analyzer can be sequentially accessed to find those intersections where the low resistance exists. From such data, the size and location of the ink droplets can be determined.

First claim

The invention claimed is:

1. A method of fabricating an analyzer for analyzing a conductive item, comprising:
forming a plurality of conductive row traces at a first level in an insulating substrate;
forming a plurality of conductive column traces at a second level in an insulating substrate;
forming conductive pillars from a surface of the analyzer to the respective conductive row and column traces, whereby a conductive item placed on the surface of the analyzer can be analyz…

Assignees

• Shadwick David Thomas
• Lexmark Int Inc

Inventors

• Shadwick David Thomas

Classifications

• Y10T29/49004

  Cross-Sectional Technologies · mapped topic

• G01B7/003 Primary

  Physics · mapped topic

• Y10T29/49155

  Cross-Sectional Technologies · mapped topic

• B41J3/46

  Operations & Transport · mapped topic