Built-in self test circuit for measuring performance of clock data recovery and system-on-chip including the same
US-2024302432-A1 · Sep 12, 2024 · US
US8996939B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8996939-B2 |
| Application number | US-201113090171-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 19, 2011 |
| Priority date | Apr 20, 2010 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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A system includes a controller configured for executing the test of the digital circuit, a memory configured for storing a status of the digital circuit, and a state machine configured for controlling, before the execution of the test, the storage into the memory of the status of the digital circuit and configured for controlling, after the execution of the test, restoring the status of the digital circuit based on the status stored in the memory.
Opening claim text (preview).
The invention claimed is: 1. A system, comprising: a controller, which, in operation, is coupled to a digital circuit and executes a series of tests of the digital circuit; a memory; and a state machine, which, in operation: controls storing of a pre-test status of the digital circuit into the memory, just before the series of tests are executed, wherein the pre-test status is obtained from the digital circuit via one or more scan chains of the digital circuit; controls seq…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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