System, Methods and Apparatus Using Virtual Appliances in a Semiconductor Test Environment
US-2015370248-A1 · Dec 24, 2015 · US
US8996919B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8996919-B2 |
| Application number | US-201313797058-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 12, 2013 |
| Priority date | Mar 13, 2012 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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A method and system for providing a self-test configuration in a device is disclosed. The method and system comprise providing a self-test mechanism in a kernel space of a memory and enabling a hook in a user space of the memory, wherein the hook is in communication with the self-test mechanism. The method and system also include running the self-test driver and utilizing the results.
Opening claim text (preview).
What is claimed is: 1. A computer implemented method for providing a self-test on one or more sensors coupled to a device, the method comprising: enabling a hook in a user space of a memory, wherein the hook is in communication with a self-test mechanism; receiving a user input via the hook; executing the self-test mechanism in a kernel space of the memory within the device; and returning the results to the user space; wherein the returning step includes returning the result…
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