Apparatus and method for analyzing a signal under test

Patent metadata

Field	Value
Publication number	US-8995510-B2
Application number	US-5521008-A
Country	US
Kind code	B2
Filing date	Mar 25, 2008
Priority date	Mar 25, 2008
Publication date	Mar 31, 2015
Grant date	Mar 31, 2015

Abstract

A portion of a signal under test corresponding to a portion of interest in an eye pattern is easily identified. An eye pattern display area displays an eye pattern that is derived from sample data of a signal under test in a bitmap form and shows frequency information with colors or brightness. A user selects an arbitrary point on the eye pattern display area with a cross-hair shaped mouse cursor, by manipulating a mouse. Thereafter, a waveform passing through the selected point is discriminably displayed, for example, with highlighted display on the eye pattern. Further, the corresponding portion of a waveform in the waveform display area is distinguishably displayed, such as with a highlighted display.

First claim

What is claimed is:

1. A signal analyzer comprising:
means for displaying an eye pattern in a first display area, said eye pattern being derived from sample data of a signal under test, said eye pattern being stored in a bitmap form and indicating frequency information with colors or brightness;
means for selecting a single point on the eye pattern,
wherein the eye pattern displaying means distinguishably displays a waveform which passes through the selected single point by hi…

Assignees

• Obata Toshiaki
• Tektronix Inc

Inventors

• Obata Toshiaki

Classifications

• G06T11/26 Primary

  Physics · mapped topic

• H04L1/205

  Electricity · mapped topic

• G01R31/31711

  Physics · mapped topic

• G06T11/206 Primary

  Physics · mapped topic