Two-tier defect scan management
US-2024402922-A1 · Dec 5, 2024 · US
US8995217B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8995217-B2 |
| Application number | US-201313783729-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 4, 2013 |
| Priority date | Jan 2, 2013 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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A method and apparatus for managing memory in an electronic system is described. The method includes determining a failure in an element of the memory array that is repairable by a redundant element. The method may further include using a latch to identify the redundant element. The method may also include that upon an event, using a value in the latch in an eFuse which subsequently selects the redundant element.
Opening claim text (preview).
What is claimed is: 1. An apparatus for managing memory in an electronic system comprising: a memory array containing a redundant element that may be activated using either a latch or an eFuse; a logic module, that is adapted to, upon the determination of a failure in an element of the memory array that is repairable by a redundant element uses a latch to identify the redundant element, and upon an event, transferring a value from the latch to the eFuse, which subsequently selects…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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