Fine particle measurement apparatus and optical axis calibration method

US8994940B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8994940-B2
Application numberUS-201113204206-A
CountryUS
Kind codeB2
Filing dateAug 5, 2011
Priority dateAug 24, 2010
Publication dateMar 31, 2015
Grant dateMar 31, 2015

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  2. Abstract

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  5. First independent claim

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Abstract

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Disclosed is a fine particle measurement apparatus including a light condensing unit that condenses irradiated light irradiated to a sample flow where fine particles pass through and directly propagates the light without scattering, and scattered light scattered by the fine particles to an optical receiver divided into a plurality of regions; a position controller that controls the relative positions of members of an optical path; and a control unit that detects positions of condensing spots of the irradiated light and the scattered light based on signal intensities of each region of the optical receiver, and controls the position controller such that the positions of the condensing spots of the irradiated light and the scattered light match with each other.

First claim

Opening claim text (preview).

The application is claimed as follows: 1. An optical axis calibration method in a fine particle measurement apparatus, the method comprising: condensing irradiated light irradiated to a sample flow where fine particles pass through and directly propagating the light without scattering, and scattered light scattered by the fine particles to an optical receiver divided into a plurality of regions; detecting positions of condensing spots of the irradiated light and the scattered li…

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What does patent US8994940B2 cover?
Disclosed is a fine particle measurement apparatus including a light condensing unit that condenses irradiated light irradiated to a sample flow where fine particles pass through and directly propagates the light without scattering, and scattered light scattered by the fine particles to an optical receiver divided into a plurality of regions; a position controller that controls the relative pos…
Who is the assignee on this patent?
Dowaki Suguru, Imanishi Shingo, Hashimoto Gakuji, and 2 more
What technology area does this patent fall under?
Primary CPC classification G01N21/4785. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 31 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).