Optical measurement method, optical measurement apparatus, and non-transitory storage medium storing optical measurement program
US-2024319486-A1 · Sep 26, 2024 · US
Diffraction microscopy
US8994811B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8994811-B2 |
| Application number | US-201113575776-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 21, 2011 |
| Priority date | Jan 27, 2010 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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Abstract
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Disclosed is a diffraction microscopy capable of reducing influence of an increase in the incident angle range of a beam. Specifically disclosed is a diffraction microscopy in which a beam is incident on a sample, in which the intensity of a diffraction pattern from the sample is measured, and in which an image of an object is rebuilt using Fourier interactive phase retrieval on the basis of the measured intensity of the diffraction pattern. In this method, Fourier interactive phase retrieval is performed using deconvolution on the diffraction pattern subjected to convolution by the increase in the incident angle range of the beam.
First claim
Opening claim text (preview).
The invention claimed is: 1. A diffraction microscopy method that radiates a beam on a sample, measures an intensity of a diffraction pattern from the sample, and uses a Fourier iterative phase retrieval based on the measured intensity of the diffraction pattern to reconfigure an image of an object, wherein deconvolution is incorporated into the Fourier iterative phase retrieval for a diffraction pattern convoluted by an angle spread of incident beam, and both are sequentially upd…
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Electricity · mapped topic
Electricity · mapped topic
Physics · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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Frequently asked questions
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- What does patent US8994811B2 cover?
- Disclosed is a diffraction microscopy capable of reducing influence of an increase in the incident angle range of a beam. Specifically disclosed is a diffraction microscopy in which a beam is incident on a sample, in which the intensity of a diffraction pattern from the sample is measured, and in which an image of an object is rebuilt using Fourier interactive phase retrieval on the basis of th…
- Who is the assignee on this patent?
- Gohara Kazutoshi, Kawahara Kota, Univ Hokkaido Nat Univ Corp
- What technology area does this patent fall under?
- Primary CPC classification G02B21/365. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Mar 31 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).