Optical measurement method, optical measurement apparatus, and non-transitory storage medium storing optical measurement program
US-2024319486-A1 · Sep 26, 2024 · US
Microscope system, surface state observing method, and surface state observing program
US8994808B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8994808-B2 |
| Application number | US-201213346304-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 9, 2012 |
| Priority date | Jan 24, 2011 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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Abstract
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To provide a microscope system enabling the user to accurately observe the surface of the observing target in a short time. A sensitivity parameter for adjusting a value of the pixel data corresponding to a plurality of pixels is set. The pixel data is acquired with a first sensitivity value set as the sensitivity parameter, and the number of pixels in which the peak value of the pixel data is smaller than or equal to a threshold value is detected. A ratio of the detected number of pixels with respect to the total number of pixels region is calculated, where the pixel data is acquired by a second sensitivity value different from the first sensitivity value when the ratio is greater than or equal to a reference value, and the pixel data is not acquired by the second sensitivity value when the ratio is smaller than the reference value.
First claim
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What is claimed is: 1. A confocal microscopy system, comprising: a light source for emitting a laser to an observing target; a scan optical system for two-dimensionally scanning the laser from the light source; an objective lens for collecting the laser scanned by the scan optical system on the observing target; a light receiving element for receiving a light, the light being a reflected light of the laser from the observing target; a pixel data output unit for outputting…
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- G02B21/365Primary
Physics · mapped topic
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Frequently asked questions
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- What does patent US8994808B2 cover?
- To provide a microscope system enabling the user to accurately observe the surface of the observing target in a short time. A sensitivity parameter for adjusting a value of the pixel data corresponding to a plurality of pixels is set. The pixel data is acquired with a first sensitivity value set as the sensitivity parameter, and the number of pixels in which the peak value of the pixel data is …
- Who is the assignee on this patent?
- Okamoto Yoichi, Karube Takuya, Keyence Co Ltd
- What technology area does this patent fall under?
- Primary CPC classification G02B21/365. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Mar 31 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).