Semiconductor Integrated Circuit and Semiconductor Device
US-2024162894-A1 · May 16, 2024 · US
US8994416B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8994416-B2 |
| Application number | US-201314045642-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 3, 2013 |
| Priority date | Jan 7, 2011 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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Official abstract text for this publication.
Adaptive scaling digital techniques attempt to place the system close to the timing failure so as to maximize energy efficiency. Rapid recovery from potential failures is usually by slowing the system clock and/or providing razor solutions (instruction replay.) These techniques compromise the throughput. This application presents a technique to provide local in-situ fault resilience based on dynamic slack borrowing. This technique is non-intrusive (needs no architecture modification) and has minimal impact on throughput.
Opening claim text (preview).
The invention claimed is: 1. A circuit comprising: a flip-flop having a D input for receiving input data, a set input, a reset input, and a Q output; a transition detector having an output configured to detect a transition in the input data within a time window; a first multiplexer having a first input for receiving a global set signal, a second input for receiving the input data, a control input coupled to the output of the transition detector, and an output coupled to the se…
Electricity · mapped topic
Electricity · mapped topic
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