Laser induced plasma micromachining (lipmm)
US-2016358759-A1 · Dec 8, 2016 · US
US8993985B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8993985-B2 |
| Application number | US-201314102545-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 11, 2013 |
| Priority date | Dec 11, 2012 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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The present invention provides a drawing apparatus which performs drawing on a substrate with a plurality of charged particle beams, including an aperture array configured to include a plurality of apertures for shaping the respective charged particle beams, a deflection unit configured to include a plurality of first deflectors which are arranged on a side, with respect to the aperture array, of a charged particle source for radiating a charged particle beam and which deflect the respective charged particle beams, and to individually change irradiated positions of the respective charged particle beams on the aperture array by driving the respective first deflectors, and a controller configured to control deflection of the charged particle beams by the first deflectors to reduce a dispersion of intensities of the respective charged particle beams on the substrate.
Opening claim text (preview).
What is claimed is: 1. A drawing apparatus which performs drawing on a substrate with a plurality of charged particle beams, comprising: an aperture array configured to include a plurality of apertures for shaping the respective charged particle beams; a first deflection unit configured to include a plurality of first deflectors which are arranged on a side, with respect to the aperture array, of a charged particle source for radiating a charged particle beam and which deflect t…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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